Gaya APA
Hosmer Jr., David W., Lemeshow, Stanley, Sturdivant, Rodney X.. (2013).
Applied logistic regression (3).
Hoboken, New Jersey:
John Wiley & Sons.
Gaya Chicago
Hosmer Jr., David W., Lemeshow, Stanley, Sturdivant, Rodney X..
Applied logistic regression.
3
Hoboken, New Jersey:
John Wiley & Sons,
2013.
Text.
Gaya MLA
Hosmer Jr., David W., Lemeshow, Stanley, Sturdivant, Rodney X..
Applied logistic regression.
3
Hoboken, New Jersey:
John Wiley & Sons,
2013.
Text.
Gaya Turabian
Hosmer Jr., David W., Lemeshow, Stanley, Sturdivant, Rodney X..
Applied logistic regression.
3
Hoboken, New Jersey:
John Wiley & Sons,
2013.
Print.