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Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists / third edition

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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.

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Ketersediaan

183000882

U 502.825 GOL s

Perpustakaan Pusat UIN

Tersedia

Informasi Detail

Judul Seri

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No. Panggil

U 502.825 GOL s

Penerbit

New York : Springer., 2003

Deskripsi Fisik

xix, 690 pages : illustrations ; 26 cm

Bahasa

English

ISBN/ISSN

9780306472923

Klasifikasi

502.825

Tipe Isi

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Tipe Media

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Tipe Pembawa

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Tahun

2003

Edisi

3

Subjek

Surfaces (Physics)
Scanning electron microscopy
X-ray microanalysis

Info Detail Spesifik

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Pernyataan Tanggungjawab

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Versi lain/terkait

Lampiran Berkas

URl Source

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